Air to Air Thermal Shock Chambers

Overview of Equipment:

TSA series (damper type, two/three zones)

Thermal shock without moving test samples
Test area capacity: 40L to 300L

Photo: TSA series (two/three zones)CE
Now more reliable than ever, the TSA series provides network connectivityTSA series is ESPEC’s best-selling damper-type thermal shock chamber.
By new instrumentation featuring significantly increased in processing speed and network connectivity, it is now possible to monitor and manage the status of chambers from remote locations even sitting at your desk.Highly accurate temperature recoveryDampers with integrated rectifying function minimize variation in exposure conditions due to specimen position within the test area.The newly developed refrigeration systemMaximum 50% reduction in power consumption with Eco operation mode and new refrigerator control systemNetwork solutionsControl and monitor your chamber on-site or remotely,edit and transfer programs from one chamber to another,and receive email alerts even on your mobile.

TSE-12 (elevator type, two zones)

Compact type thermal shock
Test area capacity: 11L

Photo: TSE-12 (elevator type, two zones)CE
Optimized size for low-volume testingThe compact thermal shock chamber answers to the need for small or low-volume specimens testing. Featuring a wide test area in a slim design, the TSE chamber offers high performances that meet severe test requirements.Quick temperature recoveryThe two zone test system (+150°C to -65°C) achieves temperature recovery time of less than 5 min, without auxiliary cooling.Meeting International StandardsThe TSE chamber achieves various tests from major international standards such as MIL, JIS…

TSD-101 (elevator type, two zones)

Large capacity, small footprint
Test area capacity: 100L

Photo: TSD-100 (two zones)CE
Uniform thermal stress performancesThe two-zone thermal shock chambers have been developed to meet major International standards for thermal shock testing.
Achieving uniform thermal stress and outstanding temperature distribution performances, the 100L test area fits for a wide range of applications in the field of research, development, inspection, and production.Meeting International StandardsTSD chamber achieves various tests from major international standards such as MIL, IEC, JIS.Reduced power consumptionEnergy saving is a great matter for us. The TSD chamber integrates many features, such as a refrigeration capacity control, to reduce the power consumption by 30%.Energy Efficient DesignNetwork solutionsControl and monitor your chamber on-site or remotely,edit and transfer programs from one chamber to another,and receive email alerts even on your mobile.
Specifications

Series

Model

Temperature range

Inside dimensions (mm)

TSA
(two/three zones) TSA-43EL High temp. exposure:Ambient temp. +50 to +200°C W240×H460×D370
TSA-73EL Low temp. exposure:–65 to 0°C W410×H460×D370
TSA-103EL W650×H460×D370
TSA-203EL W650×H460×D670
TSA-303EL   W970×H460×D670
TSA-73ES High temp. exposure:+60 to +200°C W410×H460×D370
TSA-103ES Low temp. exposure:–70 to 0°C W650×H460×D370
TSA-203ES W650×H460×D670
TSA–73EH High temp. exposure:+60 to +200°C W410×H460×D370
Low temp. exposure:–70 to 0°C
TSE
(two zones) TSE-12-A High temp. exposure: +60 to +200°C W320×H148×D230
Low temp. exposure: -65 to 0°C
TSD
(two zones) TSD-101-W High temp. exposure: +60 to +205°C
Low temp. exposure: -77 to 0°C W710xH345xD410

Features:

TSA series (damper type, two/three zones)

Remote monitor and control
No software required.
The chamber with Ethernet port can be connected to any PCs/smartphones/tablets via a web browser.
You can monitor, control the operation, and edit test profile remotely.
1000 cycles continuous operation
Defrost-free operation is provided as an option so 500-hour continuous operation can be performed without interruption (if test conditions are set for 15-minute exposure).
Highly accurate temperature recovery
Specimen temperature control
A single temperature sensor is attached to the specimen in the test area and the chamber is controlled by this temperature measurement.
Specimen temperature monitor with trigger function
Two temperature sensors are attached to the specimen in the test area to measure the specimen’s temperature.
The newly developed refrigeration system
To reduce thermal stress on the refrigerators and prevent corrosion in the circuit, the material and thickness of piping has been changed and this prevents refrigerant leaks.
Enhanced test halt preset function
It is now possible to program tests to halt after cycle or exposure completion. Six cycle counters are also built-in to the instrumentation so a test halt preset can be programmed for each counter.
Automatic setting of pre-cooling and pre-heating in energy saving, Eco operation mode (Patent pending)
The new series incorporates an algorithm that calculates the minimum operation time for pre-cooling and pre-heating by constantly measuring the amount of heat required for these processes in eco operation mode. This feature can further reduce power consumption and remove the inaccuracies and hassles caused by adjustments based on preliminary experiments.
Parallel refrigerator control system for energy-saving control (Patent pending)
The chamber can operate at the optimal refrigeration capacity based on the controlled temperature, by switching operation between two refrigerators simultaneously or a single refrigerator. At stable low-temperature exposures, power consumption is also reduced by limiting refrigeration capacity with an electronic expansion valve.
Photo: Remote monitoring and control
1000cycles (500-hour) test time comparison example
Figure: 1000cycles(500-hour) test time comparison example
Photo: Product temperature control (example)
Power consumption amount comparison example
Figure: Power consumption amount comparison example

TSE-12 (elevator type, two zones)

Test Standard Conformance

  • Meets strict Mil-Std 883 1010.8 thermal cycling requirements with 4 kg.
  • Also conformed to IEC 60068-2-14, IEC61747-5 Na.

User-friendly Touch Panel Operation

  • Operation control is done via touch panel. Very easy to use, yet full-featured.

Simple Utility

  • The only required utility is power supply.
  • The cold zone is cooled by refrigeration. No need for tanks of liquid nitrogen (or cooling water supply).

Quiet Operation

  • Super quiet operation emitting noise of less than 60dB.

TSD-101 (elevator type, two zones)

Remote monitor and control
No software required.
The chamber with Ethernet port can be connected to any PCs/smartphones/tablets via a web browser.
You can monitor, control the operation, and edit test profile remotely.
Short temperature recovery time
The two temperature zone system achieves quick specimen temperature recovery time (less than 15 min. for 10kg of ICs, at extreme temperature exposure).
Excellent temperature uniformity
Uniform airflow in test area allows outstanding temperature distribution.
It applies uniform thermal stress to specimen and contributes accurate test results.
Specimen Temperature Trigger (STT)
TSD-100 features a STT function, monitoring the specimen to launch the exposure time or going on to following step during test. Overall test duration is reduced by eliminating pretest procedures and temperature is attained with even more accuracy.
Ambient temperature recovery feature
Outside air is introduced into the test area after test is complete, to quickly restore an ambient temperature and remove specimens safely.
Viewing window (option)
Optional viewing window with interior lightning allows to check specimen and wiring during testing.
Easy wiring access
A cable port on right side allows easy wiring in specimen measurement during high and low temperature cycle test.

Specimen temperature recovery (example)
(based on MIL-883 condition C)

Test conditions

High temp. exposure: +155°C for 30 min.
Low temp. exposure: -68°C for 30 min.
Specimens: ICs, 10 kg

Temperature uniformity measurement method

Thermocouples were embedded in 10 ICs placed on two levels in each of the corners and in the center of a specimen basket. (Specimens with embedded thermocouples were placed beneath other ICs.)

Graph: Specimen temperature recovery (example)

Temperature uniformity performance (example)

Test conditions

High temp. exposure: +150°C for 30 min.
Low temp. exposure: -65°C for 30 min.
Specimens: ICs (×10)

Temperature uniformity measurement method

Thermocouples were attached to the surface of 10 ICs placed on two levels in each of the corners and in the center of a specimen basket.

Graph: Temperature uniformity performance (example)

Test time comparison (example)

Test conditions

High temp. exposure: +150°C, 15 min. after recovery
Low temp. exposure: -65°C, 15 min. after recovery
Specimens: ICs, 10kg
Control points: Upstream of sensor positions

Measurements

Test time reductions of approximately 15 minutes per cycle compared to other ESPEC models. For 3,000 cycles testing this cuts previous test times from 4.5 months to approximately 1 month.

Compatible test standards
IEC 60749-25 : Semiconductor devices – Temperature cycling

IEC 60068-2-14 Na : Environmental testing – Change of temperature

IEC 61747-5 Na : Liquid crystal and solid-state display devices – Environmental, endurance and mechanical test methods

MIL-STD-883 : Military standard, microcircuits, test standards

IPC-TM-650 2.6.6 : Temperature cycling, printed wiring board

SAE J1879 : Handbook for robustness validation of semiconductor devices in automotive applications

JASO-D902 : Durability testing methods for automotive electronic equipment

EIAJ ED-4701 : Environmental and endurance test methods for semiconductor devices. (General)

EIAJ ED-4702 : Mechanical stress test methods for semiconductor surface mounting devices

EIAJ ED-7407 : Environmental and endurance test methods for CSP, BGA package on mounting condition

 

Catalog Download, TSA

Catalog Download, TSD/TSE