Highly Accelerated Air to Air Thermal Shock Chamber (HAATS)

Quick evaluation of solder crack

As product reliability demands and testing time for stress tests are increasing, product development time is decreasing.
This model combines the newly developed highly accelerated air to air thermal shock chamber, which has reduced thermal shock testing time by one-third, with a conductor resistance evaluation system, which evaluates the reliability of connectors on print substrates and electronic parts. As a result, development time can be reduced and power consumption can be economized.

Features

<Highly Accelerated Air to Air Thermal Shock Chamber>

  • Obtain test results that correlate with a conventional thermal shock test.
  • High velocity and unique air flow control enable a temperature recovery time of 3 minutes between +125°C and -40°C. It reduces thermal shock testing time by one-third for significantly faster testing.
  • Frost-free circuit prevents the formation of frost, thereby eliminating the need to stop a test and perform defrosting.
    It reduces the time and power consumption used for defrosting.
  • With wind velocity controller allows control of wind velocity, a chamber enables conventional thermal shock testing.

<Conductor Resistance Evaluation System>

  • Constantly measure micro current and micro resistance during thermal shock tests to accurately obtain the absolute value and rate of change to determine failures.
  • Available from a direct current measurement system and an alternating current measurement system.
Test cases of confirming validity of velocity (one-third the exposure time of conventional test)
Highly accelerated thermal cycle test
(air chamber)
Conventional thermal cycle test
(air chamber)
Temperature width -40°C ⇔ +125°C(⊿t=165°C)
Exposure time 5 minutes 15 minutes
Temperature profile Graph: Temperature profile Graph: Temperature profile
High temperature
(+123°C or more)
Low temperature
(-38°C or less)
High temperature
(+123°C or more)
Low temperature
(-38°C or less)
Substrate temperature recovery time 1.1 to 1.3 minutes 1.5 to 2.5 minutes Substrate temperature recovery time 3.4 to 7.9 minutes 3.7 to 6.2 minutes
Substrate temperature hold time 3.7 to 3.9 minutes 3.5 to 2.5 minutes Substrate temperature hold time 7.1 to 11.6 minutes 8.8 to 11.3 minutes

Proposal of a new test method

Cross-section observation
There is no notable difference in cracking or advancing

Highly accelerated method

Highly accelerated method: 500cycle
500cycle
Highly accelerated method: 1000cycle
1000cycle
Highly accelerated method: 2000cycle
2000cycle

Conventional method

Conventional method: 500cycle
500cycle
Conventional method: 1000cycle
1000cycle
Conventional method: 2000cycle
2000cycle

Strength test
There is no difference in the joining strength deterioration

Strength test / There is no difference in the joining strength deterioration

Specifications

<Highly Accelerated Air to Air Thermal Shock Chamber>

Model TSH-13-W
Method Temperature recovery (highly accelerated operation)
Performance High-temperature exposure +60°C to +200°C
Low-temperature exposure -70°C to 0°C
Temperature recovery (highly accelerated operation) High-temperature exposure: +125°C 5 minutes
Low-temperature exposure: -40°C 5 minutes
Specimen: 1.36 kg
(using a glass epoxy substrate)
Temperature recovery rate: within 3 minutes
System Mechanical two-way refrigeration system (water cooled)
Construction Inside capacity 12L
Test area W300×H200×D200mm
Outside dimensionsW1430×H1900×D1370mm
Weight Approx. 1,070 kg

<Conductor Resistance Evaluation System (direct current measurement system)>

Model AMR-040-UD
Measurement system Electric current measurement system
Channel construction 40 standard channels (max. 280 channels per rack))
Channel control 10 channel unit
Resistance measurement range 1.0×10(-3)~1.0×10(6)Ω
Measurement range 1Ω, 10Ω, 100Ω, 1kΩ, 10kΩ, 100kΩ, 1MΩ, AUTO
Measuring instrument Model:34420A (Agilent Technologies)
Outside dimensions W530×H1750×D940mm

<Conductor Resistance Evaluation System (alternating current measurement system)>

Model AMR-040-UA
Measurement system Electric current measurement system
Channel construction 40 standard channels (max. 280 channels per rack)
Channel control 10 channel unit
Resistance measurement range 1.0×10(-3)~1.0×10(6)Ω
Measurement range 10mΩ, 100mΩ, 1Ω, 10Ω, 100Ω, 1kΩ, 10kΩ, AUTO
Measuring instrument Model:4338B (Agilent Technologies)
Outside dimensions W530×H1750×D940mm